The European Space Agency (ESA) is accelerating a quiet revolution on the factory floor: using artificial intelligence to design, inspect, ...
Machine learning enables real-time PCB defect detection using a FOMO model on a Raspberry Pi. Learn how with this ...
Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...
Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
A collaborative team led by Prof. Yi Xiong from Wuhan Textile University, Prof. Wei Zeng from Anhui University, and Prof.
Alpha Software (781-229-4500) has introduced manufacturing quality solutions built on its Alpha TransForm no‑code platform to help quality teams detect assembly line defects earlier in the process.
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