The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...
Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...
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