Testing verifies that protection schemes meet their intended purpose, ensuring safety and system integrity. Function testing involves manual or electrical manipulation of components to confirm signal ...
Our second C-Brief discusses where system-level test (SLT) best fits into your semiconductor test workflow. With automated testing equipment (ATE), a traditional workflow may consist of: Wafer sort ...
Decades of advances in the semiconductor industry continue to drive an insatiable consumer demand for smaller, more powerful, more ubiquitous semiconductor devices—whether in our cars, within our ...
Astronics released its next-generation circuit card diagnostic and test system, the PinPoint 3-PXIe (P3-PXIe). Combining more than 30 years of development of the PinPoint Circuit Card diagnostic ...
Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...
WASHINGTON — Functional testing of the U.S. Navy’s second-generation Aegis Ballistic Missile Defense (BMD) system, due to become operational in 2012, was completed in June, Lockheed Martin officials ...
The Changing Role of DC Power in Electronics Manufacturing Electronics factories today operate far beyond traditional assembly-and-test models. Whether producing communication modules, LCD displays, ...
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