Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...
Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...
The field of additive manufacturing is undergoing a profound transformation as artificial intelligence (AI) and machine learning (ML) become integral to the ...
The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
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