EDN

Contactless Testing Wafer Testing

STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, announced the successful production of the world’s first semiconductor wafer whose ...
DatacenterDynamics

Wafer-level testing for next-generation co-packaged optics

DatacenterDynamics is the world's largest data center publication. We publish news, magazine features, and podcasts about the ...
EDN

Inspecting the wafer test

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...
Electronics360

Three big semiconductor test probe challenges

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...
DIGITIMES

Ardentec launches ASIC wafer test collaboration; new Longtan capacity to be ready by 2H26

Semiconductor testing firm Ardentec is optimistic about its future operations, driven by sustained strong orders in ...
Semiconductor Engineering

Heating Up Cryogenic Wafer Testing

The use of on-wafer superconducting materials, other novel materials, and traditional semiconductors at cryogenic temperatures (below about 123K, or -150°C) has grown quickly in recent years.
Seeking Alpha

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...
Nasdaq

Aehr Receives FOX-XP™ Multi-Wafer Test & Burn-in Solution Order as Silicon Photonics Customer Makes Transition to Volume Production

FREMONT, Calif., March 01, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has ...
Semiconductor Engineering

Wafer Test Challenges For Chiplets

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage.
Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Seeking Alpha

Aehr Announces Initial FOX-XP Multi-wafer Test and Burn-in Production System Order from Major Gallium Nitride Power Semiconductor Supplier

FREMONT, CA / ACCESSWIRE / January 7, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial production order ...