The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...
SANTA CLARA, Calif. — Looking to reduce the soaring costs of IC test, Intel Corp. hopes to leverage its “causal learning algorithm” technology for wafer sorting applications in the fab. Intel is ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results