As global energy demand surges—driven by AI-hungry data centers, advanced manufacturing, and electrified ...
Abstract: Wafer mappings (WM) help diagnose low-yield issues in semiconductor production by offering vital information about process anomalies. As integrated circuits continue to grow in complexity, ...
Abstract: Most near-field (NF) localization algorithms cannot deal with the underdetermined case, while those which can are computationally expensive due to employment of fourth-order cumulants. In ...
It’s easy to complicate things when picking numbers in the North Carolina lottery, but 5,000 people just made all that fretting look silly. When pressed to come up with numbers in the Pick 3 game, ...
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